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Home arrow Industry News arrow Semiconductor arrow Functional Test Technology Partners
Functional Test Technology Partners | Print |

Eindhoven - June 22, 2009 - Following a successful series of JTAG /

Functional test seminars in Europe and the United States, Geotest - Marvin

Test Systems and JTAG Technologies are pleased to announce a new Technology

Partnership. Under the partnership, Geotest now offers pre-configured PXI

test systems including the JTAG Technologies' high-performance JT 37x7/PXI

boundary-scan controller. Included with the boundary-scan test option is

JTAG Technologies' high-level driver suite for Geotest's ATEasy software

which facilitates integrating boundary-scan applications as part of an

overall functional test strategy.

The preconfigured Geotest Basic Automated Test System (GBATS) offers

functional and structural test methods in a compact PXI-based platform as

well as providing high-throughput in-system programming for flash memories

and programmable logic devices.

Peter van den Eijnden, Director JTAG Technologies commented, "We're very

pleased to have worked with Geotest in offering the test community such a

practical and beneficial system. During the recent seminars, we've had a

good close-up view of customer needs and the combined capability we offer

with Geotest should be right on target."

Mike Dewey, Geotest's Senior Marketing Product Manager, added, "Combining

functional and boundary scan test methods is a test strategy that we see

more and more users adopting. Our partnership with JTAG Technologies is a

natural fit for providing customers with solutions that meet these demands

and address the need for test coverage and throughput, particularly for

boards with limited test access."

The GBATS TS-720 system with the JT controller is available in 6-8 weeks.

JTAG Technologies' PIP/ATEasy software integration package is available

immediately.

 
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